NIST LATEX SPHERE CALIBRATION STANDARDS

Technology Overview:

We specialize in producing NIST traceable and Quick Check Latex Sphere Calibration Standards for KLA-Tencor Surfscan, Estek/ADE/Aeronca and other wafer inspection systems. They are produced for both patterned and unpatterned inspection tools, in variety of diameters and micron sizes, with custom deposition available, whenever you need it!

We also produce Custom Films and Substrates Standards.

Our Calibration Standards are available in half, full, circle or double deposition.

You can request Calibration Standards Price List here.

In the process of production, we use our own particle deposition technology (Particle Deposition System SST-1200) and our proprietary Sticky Sphere Technology to ensure non-clumping and random distribution of polystyrene latex spheres on the wafer's surface. The actual number of PSL's deposited on surface of silicon wafer can vary, depending on kind of the tool and your particular needs.

Properly calibrated particle counter and other wafer inspection equipment ensure accurate semiconductor measurements.

We strongly recommend using our calibration standards for quality control, as well as other semiconductor metrology needs.

Our Standards come with Certificate of Traceability to NIST and 90 DAY NO-FAULT WARRANTY .

And now, you can save even more with Brumley South: for your daily checks you can use Brumley South Quick Check Quality Control Standards, with prices starting at $500 and up!

Want to make Calibration Standards in-house? Consider our Particle Deposition System SST-1200!