Nanoline 50-2C CD Measurement System - Parts - Hot Swap & Loaner Systems - Refurbishment - Upgrade Design!
OVERVIEW
Nanoline 50-2C CD Measurement System is critical dimension measurement and inspection system for etching and lithography process control.
Highly stable scanning microdensitometer design, with sub-micron CD metrology capability and better than 0.025 micron measurement precision.
System measures lines, spaces and contact holes.
Applications include semiconductor wafers, photomasks, magnetic heads and memory disks.
Autofocus ans easy-to-use software included.
NEWSLETTER SIGNUP
- Nanoline 50-2C Quote Request
- Nanometrics Repair, Service, Upgrade Design FAQ
- Nanometrics Training Classes
- Nanometrics Parts - Hot Swap & Loaner Systems - Refurbishment - Upgrade Design
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