Quick-Check Calibration Standards
Quick Check Calibration Standards are Non-NIST traceable calibration references that can save you lots of money, when you perform your daily checks.
They also come with half, full, double or circle deposition and can be used to calibrate your wafer inspection system on daily basis.
They are great for checking size accuracy, orientation problems with the optics and using the clean side of the wafer as a control side.
We use our proprietary Sticky Sphere Technology to guarantee that the PLS's are Non-Clumping and random in distribution for the Highest Quality Calibration Standards available.
Properly calibrated particle counter and other wafer inspection equipment ensure accurate semiconductor measurements!
We strongly recommend using our standards for quality control, as well as other semiconductor metrology needs.
NEWSLETTER SIGNUP
- Custom Depositions Quote Request
- NIST Latex Sphere Calibration Standards - technology overview
- Calibration Standards - deposition choices
- Particle Deposition System SST-1200 - make calibration standards In-House!
- Wafer inspection equipment refurbished, ready for sale
- Rental Plans on selected metrology equipment
- KLA-Tencor 6420 Surfscan film inspection system refurbished
- AlphaStep Problems? Ask our AlphaStep Support Engineer!
- Nanometrics Support - refurbishment, service and parts, loaner systems, and more
- Dryden Engineering Q-III Surface Particle Detector
- Kensington Labs robot repair, service & support on all wafer handling equipment, including Sorters
HAVE QUESTIONS
ABOUT THIS PRODUCT?
Click Here
OR call (704) 664-9251
