KLA-Tencor P-11 long scan surface profiler
SPECIFICATIONS
Computerized, highly sensitive Surface Profiler that measures roughness, waviness, step height, and other surface characteristics in a variety of applications.
It features the ability to measure micro-roughness with up to 0.5Å (0.002 min.) resolution over short distances as well as waviness over a full, 205-mm (8.1-in.) scan.
The built-in PC computing power offers precise, automatic measurement capability with the convenience and ease of use of Microsoft Windows-based software control and data analysis.
The KLA-Tencor P-11 can profile a variety of materials, including
- Semiconductor wafers
- Thin-film heads
- Precision-machined and polished surfaces
- Ceramics for micro-electronics
- Glass for flat panel displays
- Optical surfaces
NEWSLETTER SIGNUP
- Tencor P-11 Quick Quote
- Tencor P-11 features
- Wafer inspection equipment refurbished, ready for sale
- Are you waiting too long for your robot/controller to be repaired?
- Nanometrics Support - refurbishment, service and parts, loaner systems, and more
- Dryden Engineering Q-III Surface Particle Detector remanufactured
- Kensington Labs robot repair, service & support on all wafer handling equipment, including Sorters
- AlphaStep Problems? Ask our AlphaStep Support Engineer!
- Tencor Flexus 2320 refurbished
- NIST traceable Latex Sphere Calibration Standards
- AlphaStep Calibration Standards
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