ESTEK WIS-8500 REFURBISHED

System Specifications:

• Detection 0.17 um on Silicon at 95% capture rate. Verified by NIST Standards.
• 2 to 8 inch capable with proper setup. Current configuration is 4 to 8 inch.
• Dark channel system. Dark channel is used for detecting particles and any light scattering defects.
• Built-In computer to store wafer data and images.
• Complete data statistics collection package.
• Argon Ion 488nm laser.
• Remanufactured System to factory production specifications.
• NIST Calibration.
• Warranty 90 days, Parts and labor. Travel Expense not included.
• Automatic cassette-to-cassette robotic wafer transport system.
• Non-contaminating robotic wafer handling system with sorting capability.
• Wis-8500D model/ includes two random access stages. Wafers per hour, 60.
• Configured to run Fluoroware PA-72 Series Cassette
• Data printer.
• New Color Monitor to display wafers.
• Haze reporting channel.